Test Probes & Interfacing Components

Test probe – test pin – spring probe – pogo pin

These are all generic terms to describe a component whose spring loaded tip will provide a reliable electrical contact to a target whose distance away may well be variable or indeterminate.

The traditional use for them is to make contact with printed circuit boards (PCBs) or electrical components, in order to test functionality and to measure the value of the components. They are widely used in vacuum test fixtures associated with automatic test equipment (ATE). They are also used inside a functional test station as part of a larger production line.

Robust, easily customised, standalone kits for testing a variety of PCBs.

• Repair and calibration stations
• Low to medium volume testing of PCBs – such as power supplies and control boards
• Functional testing and alignment of modules & sub-assemblies

A range of test products for wide variety of test applications

Spring loaded components for a wide range of data, power & battery charging applications.